High-Resolution Thermal and Photon Imaging Systems for Semiconductor Failure Analysis
Optotherm is a globally recognized manufacturer specializing in thermal analysis and photon imaging technologies.
Their systems are designed for advanced fault isolation and diagnostics of semiconductor chips, circuit boards, and packaged devices.
SEKOA supplies three key Optotherm systems to customers in Korea and around the world:
Optotherm systems provide non-destructive thermal and
photon emission imaging to detect semiconductor defects with precision.
Used globally for FA labs, these tools support advanced failure analysis
with high sensitivity and real-time visualization.
Enabling Reliable Performance for Advanced Semiconductors
Today’s smartphones, next-gen gaming consoles, and smartwatches rely on increasingly complex and miniaturized semiconductor chips.
Optotherm’s thermal and photon imaging systems play a critical role in failure analysis and quality validation of these advanced devices.
Smaller Chips, Higher Expectations for Analysis.
Modern semiconductor chips are packed with billions of transistors,
growing ever smaller with each new generation.
This shrinking scale demands more precise and sensitive tools
for failure analysis and reliability validation.
Optotherm’s thermal and photon imaging systems deliver
the high-resolution insights needed to locate defects quickly and accurately,
helping customers reduce development time and improve yield.
EMMI Sentris Electronics Failure Analysis System
Optotherm systems
Optotherm is a leading manufacturer of thermal and photon imaging systems for advanced semiconductor failure analysis.
SEKOA supplies the following three flagship systems to customers in Korea and worldwide.
IS640-17
Optotherm's flagship thermal imaging system detects and analyzes fine heat sources on circuit boards and packaged devices with high spatial resolution.
IS640-17Optotherm's flagship thermal imaging system detects and analyzes fine heat sources on circuit boards and packaged devices with high spatial resolution.
MW640-15
A Lock-in Thermography system that visualizes subtle resistive defects inside semiconductor devices by generating phase images. It effectively isolates defects even in complex signal environments with minimal noise.
MW640-15A Lock-in Thermography system that visualizes subtle resistive defects inside semiconductor devices by generating phase images. It effectively isolates defects even in complex signal environments with minimal noise.
SW640-5
An EMMI (Emission Microscopy) based photon imaging system that detects leakage currents, shorts, and degradation phenomena through non-contact photon emission analysis of active semiconductor circuits.
SW640-5An EMMI (Emission Microscopy) based photon imaging system that detects leakage currents, shorts, and degradation phenomena through non-contact photon emission analysis of active semiconductor circuits.
The road to advanced
fault analysis
Advancing Precision in Semiconductor Failure Analysis
For over two decades, Optotherm has developed advanced thermal and photon imaging technologies to support high-resolution semiconductor failure analysis.
Its systems detect subtle thermal and photon emissions from chips, packages, and PCBs, enabling precise diagnostics of microscopic defects.
SEKOA delivers Optotherm’s core solutions to customers in Korea and worldwide, backed by localized technical support.
