Toho Metrology Systems
Toho Technology provides non-contact carrier profiling and mobility analysis solutions for high-precision evaluation of the electrical properties of semiconductor materials. Its key systems, including the ECV Pro+ and HL9900, offer high-resolution carrier concentration and mobility profiling, non-destructive thin-film thickness and sheet resistance measurements, and support a wide range of semiconductor samples including Si, III-V, compound, and emerging materials. SEKOA supplies and supports these precision metrology tools to customers in Korea and across global markets.