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Toho Technology
HL9900

HL9900은 고저항부터 저저항 시편까지 폭넓은 소재를 대상으로 이동도와 캐리어 특성을 정밀하게 평가하도록 설계된 고정밀 Hall Effect 측정 시스템입니다. 다양한 반도체 소재 
분석을 지원하며, 공정·소재 연구에 필요한 신뢰도 높은 전기적 파라미터를 제공합니다.

100 nA ~ 19.9 Ma

Current Range

AC 213 Hz / DC

Measurement Modes

90 K ~ 500 K

Temperature Range

±0.1 K

Temperature Stability

5 minutes

Cool-down Time

15 x 15 mm

Max Sample Size

Keyfeatures & benefits


The Toho HL9900 is a high-precision Hall Effect measurement system designed for mobility and carrier profiling across a wide range of semiconductor samples.



Combining wide current range, high voltage sensitivity, and precise temperature control, the HL9900 enables accurate Hall measurements across a broad spectrum of semiconductor samples. Its fast cool-down and stable cryogenic operation support efficient, repeatable mobility and carrier profiling.




01. Broad Current Range & Versatility

The HL9900 offers a wide current range from 100 nA to 19.9 mA with a compliance voltage of 20 V, enabling accurate and stable Hall effect measurements. This broad operating range supports various sample types with both high and low resistivity, making it suitable for diverse semiconductor materials in research and  production.


02. Fast Cryogenic Temperature Control

Equipped with the HL9950 cryostat, the HL9900 supports temperature-controlled measurements from 90 K to 500 K with ±0.1 K stability and a fast 5-minute cool-down time. This allows for efficient and repeatable testing across a wide temperature range, critical for characterizing temperature-dependent electrical behavior in advanced semiconductor devices.


03. Ultra-Sensitive Voltage Detection

The HL9900 provides exceptional voltage sensitivity down to 0.8 µV pk-pk and a low noise level of 15 nV/√Hz at 213 Hz. This enables accurate detection of weak signals, making it ideal for analyzing carrier mobility, carrier concentration, and other electrical parameters with high precision—even in challenging low-signal environments.

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