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Optotherm

IS640-17

IS640-17은 고해상도 적외선 이미징 기반의 열 분석 시스템으로,
첨단 반도체 불량 진단을 위해 정밀하게 설계된 장비입니다.


칩·패키지·PCB 전반에 걸친 미세 온도 편차를 정교하게 포착하여,
잠재적 핫스팟과 결함을 신속하고 정확하게 식별합니다.

640x480 pixels

Array Size 

17 µm

Detector Pitch

7-14 µm

Spectral Response

< 30 mK

NETD

60 Hz

Frame Rate

5 µm

(with 5 Micron Lens)

Pixel Resolution

Keyfeatures & benefits


High-Resolution Infrared Imaging System for Semiconductor Failure Analysis



The IS640-17 is a high-performance, uncooled microbolometer-based infrared camera designed to precisely detect thermal anomalies in semiconductor chips, packages, and circuit boards.

SEKOA supplies this system, along with other Optotherm analysis solutions, to customers in Korea and worldwide.




01. High-Resolution, Real-Time Thermal Imaging

Equipped with a 640×480 a-Si uncooled microbolometer sensor, the IS640-17 offers up to 5μm spatial resolution and a real-time 60Hz frame rate. It accurately detects fine thermal abnormalities in chips, substrates, and packages. Thermal sensitivity is rated at <30mK (up to <12mK in high-sensitivity mode).


02. Integrated Thermalyze Software for Automated Analysis

Thermalyze software provides advanced diagnostic tools such as Lock-in Thermography, Overlay/ Subtraction comparison, strip chart display, histogram-based analysis, and more.

It also supports per-region emissivity settings, alarm triggers, and automated reporting.


03. Flexible Positioning Stage Options

The system supports both motorized and manual XYZ stages for precise positioning of wafers, chips, and various package sizes.

It is optimized to identify defects such as leakage current, power rail resistance, ESD damage, shorts, and opens with non-destructive efficiency.

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