• # EMMI 적외선 열영상 결함 분석 장비
  • 종합반도체(IDM) / 디스플레이 / Junction 극소결함 / 부품 / PCB 결함 분석 / 미세 결함 불량 위치 및 깊이 측정
  • Hot spot(핫스폿) / 쇼트(Short) & 누설전류(Leakage Current) 
  • # 비접촉 박막 두께 측정기
  • 반도체 장치, 안경, 스텐트, 태양 전지, 폴리머 코팅, 포토레지스트, 태양 전지 패널, LCD, MEMS 및 주사기 제조업체
  • 1nm 에서 2mm 까지 두께 측정
  • 학교 / 연구실 / 인라인 / 곡면 / 대형 부품 / 게이트형 박막 / 소형 난시 보정 분광계 측정 등  

EMMI 적외선 열영상 결함 분석 장비_종합반도체(IDM)/디스플레이/Junction 극소결함/부품/PCB 결함 분석/쇼트 및 누설전류 미세 결함 불량 위치 및 깊이 측정

Trailblazing for a better world
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Optotherm Story

In 2002, we developed our first thermal imaging system for circuit board failure analysis and have since expanded into semiconductor failure analysis and microscopic thermal analysis.

In order to create tightly integrated systems including both hardware and software, we design and manufacture our own line of long wavelength thermal imaging cameras, infrared lenses, thermoelectric controllers, and image analysis/testing software.  We are currently developing a new line of short wavelength InGaAs cameras for use in semiconductor failure analysis and testing.

Our manufacturing facility is located in Sewickley, PA, USA and we have maintained ISO 9001 Quality Management System certification since 2020. 


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SEKOA Company

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With the best products and solutions, we strive to provide a valuable experience for all. We ask for your continued interest and support for SEKOA with Optotherm

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